heliInspectで得られた高さ画像から金属表面等に見られる連続的な面の粗さ(Ra値)を計測することが可能です。
また位相モードを使用することで数nmレベルの凹凸を計測することもできます。
CASE適用事例
面の粗さ計測
2015.11.12
半導体/IC
heliotis
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